Microtronic Announces Real-time Macro Defect Monitoring – Within Semiconductor Processing Equipment
HAWTHORNE, N.Y., July 17, 2020 /PRNewswire/ — SEMICON West 2020 – Microtronic, maker of high-speed full-wafer macro defect inspection systems and software, has just announced an innovative new way to automatically detect and manage wafer processing defects, beginning at the source – from…
Comments Off on Microtronic Announces Real-time Macro Defect Monitoring – Within Semiconductor Processing Equipment